National Instruments Pxie-5840 Bluetooth Test Toolkit User Manual (+ PDF)

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1 PXIe-5840 Bluetooth Test Toolkit

2 PXIe-5840

2.1 Key Features

2.2 Supported Measurements

2.5 Application Programming Interface (API)

2.6 Supported Hardware

2.7 Documents / Resources

2.7.1 References

PXIe-5840 Bluetooth Test Toolkit

PXIe-5840

The PXIe-5840 is a Bluetooth Test Toolkit that is built for
Bluetooth characterization test and measurement. It features key
components such as Soft Front Panel, Application Programming
Interface (API), and Supported Hardware. With this toolkit, you can
perform accurate and fast measurements of Bluetooth Classic,
Low-Energy, and Direct Test Mode signals. You can also simulate and
manipulate Bluetooth signals, and inject various impairments to
characterize effects on the resulting signal measurements.

Key Features

Bluetooth Classic, Low-Energy, and Direct Test Mode
Fast and Accurate Measurements
Simulation

Supported Measurements

The PXIe-5840 supports a variety of measurements such as
Modulation and Spectral measurements. Combine the Bluetooth Test
Toolkit with a Vector Signal Transceiver (VST) to achieve
industry-leading modulation and spectral measurements. The average
time for a DEVM measurement is less than 33 ms.

Modulation

The PXIe-5840 provides accurate Mean Block EVM in loopback using
a VST. The table below shows the Mean Block RMS EVM (%) and Mean
Block RMS Magnitude Error (%) for different Tx Power Levels.

Tx Power Level	Mean Block RMS EVM (%)	Mean Block RMS Magnitude Error (%)
0	0.59	0.41
-5	0.56	0.40
-10	0.54	0.38
-15	0.52	0.36

The figure below shows the Constellation plot of a 3-DH5 signal;
RMS DEVM measurement; payload symbol DEVM (%).

Constellation plot of a 3-DH5 signal

Spectral

The PXIe-5840 also supports Spectrum measurement speeds using
the NI Bluetooth Suite and the VST. The table below shows the
Measurement Time for different types of measurements.

Type of Measurement	ACP (79 channels 3-DH5 packet type -25 dBm main ch power)	ACP (10 channels, 3-DH5 packet type, -25 dBm main ch power)	DF1 (DM1 packet type) -15 Value
Measurement Time	< 330 ms	< 170 ms	Df1avg = 80.87 KHz < 8 ms

The figure below shows the Tx output power spectrum
measurement.

Tx output power spectrum measurement

Simulation

The Bluetooth Test Toolkit enables you to simulate and
manipulate Bluetooth signals. You can also inject various
impairments to characterize effects on the resulting signal
measurements. The figure below shows the code to simulate the
effects of hardware impairments on the BT signal.

Code to simulate the effects of hardware impairments on the BT signal

Soft Front Panel

The PXIe-5840 comes with Soft Front Panels (SFPs) that you can
use to generate and analyze Bluetooth signals. You can define
custom payloads, and inject signal impairments such as noise, IQ
imbalance, skew, and DC offset. Furthermore, the SFPs allow you to
save waveforms and measurements for either later modulation and
spectral analysis or for loading equivalent settings into the
programmable API. The figure below shows Bluetooth generation and
analysis soft front panels.

Bluetooth generation and analysis soft front panels

Application Programming Interface (API)

The Bluetooth Test Toolkit includes an API for LabVIEW, C, and
.NET, with which you can create custom code for all kinds of test
scenarios or custom settings. The API gives you fine control over
the Bluetooth packets, and it includes an extensive library of
example code to get you started quickly on the many different
Bluetooth measurements for the various types of packets, including
Bluetooth Low Energy. The figure below shows an example of a custom
LabVIEW front panel for waveform analysis.

Example of a custom LabVIEW front panel for waveform analysis

Supported Hardware

The Bluetooth Test Toolkit is compatible with several RF VSTs
and certain VSAs, so you can choose a device based on the specific
needs of your application. The table below shows the NI hardware
that is compatible with the Bluetooth Toolkit.

NI Hardware Compatible with the Bluetooth Toolkit
NI PXIe-5668R
NI PXIe-5820
NI PXIe-5840

For more information about the Bluetooth Test Toolkit, please
visit the NI website.

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PXIe-5840

Have a question? Contact Us.
PRODUCT FLYER
Bluetooth Test Toolkit
CONTENTS
Bluetooth Test Toolkit Key Features Soft Front Panel Application Programming Interface (API) Supported Hardware Supported Measurements Platform-Based Approach to Test and Measurement PXI Instrumentation Hardware Services
Page 1 | ni.com | Bluetooth Test Toolkit

Bluetooth Test Toolkit
Learn more about Bluetooth Test Toolkit
· Generate and analyze Bluetooth: 1.x, 2.x+EDR, 3.x+HS, 4.2, LE, and 5.0 LE (2 Mbps data rate) · Characterize performance of Bluetooth design with easy-to-use soft front panels · Automate Bluetooth measurements with comprehensive LabVIEW and C APIs · Integrate with PXI Vector Signal Transceiver (VST), or separate PXI Vector Signal Generators
(VSGs) and PXI Vector Signal Analyzers (VSAs)
Built for Bluetooth Characterization Test and Measurement
The Bluetooth Test Toolkit gives you direct and fine control over the generation and analysis of Bluetooth waveforms with industry-leading speed and accuracy. Use the Bluetooth Test Toolkit to characterize a variety of Bluetooth connectivity products, such as RF front end components, wireless modules, and enduser devices. The Bluetooth Test Toolkit gives you the flexibility to control your measurement system manually with the toolkit’s generation and analysis soft front panels, as well as to automate your bench with an extensive system design software API for LabVIEW, C, or .NET. You will benefit from a large collection of available example code when programming and automating your Bluetooth measurement systems. Characterize your device with the toolkit’s comprehensive support for the latest features of the Bluetooth standard, including Low-Energy, extended payload, and long-range packets that are part of the Bluetooth 5.0 standard.
Page 2 | ni.com | Bluetooth Test Toolkit

Key Features
Bluetooth Classic, Low-Energy, and Direct Test Mode
The Bluetooth standard now defines specific Bluetooth Low-Energy (BLE) RF PHY Test Cases and a new Direct Test Mode (DTM) for DUT control to make sure that Bluetooth Low-Energy devices from all manufacturers operate properly. This standardization also verifies that a basic level of system performance is guaranteed for all BLE products. With both DTM and a more relaxed RF PHY specification for Bluetooth Low-Energy, fewer PHY test cases and optimized test case implementations contribute to much shorter BLE RF PHY test times. The NI Bluetooth Test Toolkit supports these BLE measurements and the new packet types associated with them, such as:
· LE Packet · LE Extended payload packet (255 bytes) · LE-Enhanced (1 and 2 Mbps) · LE-Long range (125 and 500 kbps) Additionally, the toolkit ships with a Direct Test Mode Interactive Example to help you control and test BLE DUTs easily.
Figure 1. Direct test mode interactive example
Page 3 | ni.com | Bluetooth Test Toolkit

Fast and Accurate Measurements
Combine the Bluetooth Test Toolkit with a VST to achieve industry-leading modulation and spectral measurements; the average time for a DEVM measurement is less than 33 ms.
Modulation
Table 1. Mean Block EVM in loopback using a VST

Tx Power Level Mean Block RMS EVM (%) Mean Block RMS Magnitude Error (%)

0.59

0.41

-5

0.56

0.40

-10

0.54

0.38

-15

0.52

0.36

Figure 2. Constellation plot of a 3-DH5 signal; RMS DEVM measurement; payload symbol DEVM (%)
Spectral
Table 2. Spectrum measurement speeds using the NI Bluetooth Suite and the VST

Type of Measurement ACP (79 channels 3-DH5 packet type -25 dBm main ch power) ACP (10 channels, 3-DH5 packet type, -25 dBm main ch power) DF1 (DM1 packet type) -15

Value

Measurement Time

-79 dBm

< 330 ms

-79 dBm

< 170 ms

Df1avg = 80.87 KHz < 8 ms

0.52

0.36

Page 4 | ni.com | Bluetooth Test Toolkit

Figure 3. Tx output power spectrum measurement
Simulation
The Bluetooth Test Toolkit enables you to simulate and manipulate Bluetooth signals. You can also inject various impairments to characterize effects on the resulting signal measurements.
Figure 4. Code to simulate the effects of hardware impairments on the BT signal
Page 5 | ni.com | Bluetooth Test Toolkit

Soft Front Panel
Use soft front panels (SFPs) to generate and analyze Bluetooth signals, define custom payloads, and inject signal impairments such as noise, IQ imbalance, skew, and DC offset. Furthermore, the SFPs allow you to save waveforms and measurements for either later modulation and spectral analysis or for loading equivalent settings into the programmable API.
Figure 5. Bluetooth generation and analysis soft front panels
Page 6 | ni.com | Bluetooth Test Toolkit

Application Programming Interface (API)
The Bluetooth Test Toolkit includes an API for LabVIEW, C, and .NET, with which you can create custom code for all kinds of test scenarios or custom settings. The API gives you fine control over the Bluetooth packets and it includes an extensive library of example code to get you started quickly on the many different Bluetooth measurements for the various types of packets, including Bluetooth Low Energy.

Figure 6. Example of a custom LabVIEW front panel for waveform analysis

Supported Hardware

The Bluetooth Test Toolkit is compatible with several RF VSTs and certain VSAs, so you can choose a device based on the specific needs of your application.

Table 3. NI hardware compatible with the Bluetooth Toolkit

Instrument

Real-Time Bandwidth

PXIe-5644 VST

Up to 80 MHz

PXIe-5645 VST with Baseband IQ Input and Output Up to 80 MHz

PXIe-5646 VST

Up to 200 MHz

PXIe-5840 VST

Up to 1 GHz

PXIe-5668 VSA

Up to 765 MHz

Page 7 | ni.com | Bluetooth Test Toolkit

Supported Measurements

Transmit Power

Total Average Power Maximum Average Power Minimum Average Power

Access Code and Header Average Power
Payload Average Power

Demodulation Measurements

DF1 Average Block df1max
DF1 Average Frequency Deviation Trace
DF2 Average Block df2max Trace

Bits above 185kHz DF2Max Threshold (%)
Max Payload Block Frequency Offset
Max Carrier Drift / 55us

DF2 Average Frequency Deviation Trace

DF2 Block Frequency Offset Trace

Max ICFT Max Carrier Drift Max Carrier Drift/50us

DF2 Maximum Block df2max Trace
DF2 Minimum Block df2max Trace

DEVM

Mean Block RMS DEVM (%)
Maximum Block RMS DEVM (%)
Mean Symbol DEVM (%)
Maximum Symbol DEVM (%)
99% DEVM (%)
Mean Block RMS Magnitude Error (%)
Maximum Block RMS Magnitude Error (%)
Mean Block RMS Phase Error (deg)
Maximum Block RMS Phase Error (deg)

Mean Packet Initial Frequency Offset (Hz)
Maximum Packet Initial Frequency Offset (Hz)
Mean Block Absolute Frequency Offset (Hz)
Maximum Block Absolute Frequency Offset (Hz)
Mean Block Relative Frequency Offset (Hz)
Maximum Block Relative Frequency Offset (Hz)
Symbols below 99% DEVM Threshold (%)

Spectral Measurements

Peak Power

TxSpectrum

TxP Average

ACP

Power versus Time

EDRInBandEmission

Bandwidth

LEInBandEmission

Payload Relative Power
CFO Block Frequency Offset CFO Payload Frequency Deviation Max ICFT Max Carrier Drift Max Carrier Drift / 50us Max Payload Block Frequency Offset (Hz) Max Carrier Drift / 55us
Impairments: IQ Gain Imbalance (dB) Impairments: Quadrature Skew (deg) Impairments: I DC Offset (%) Impairments: Q DC Offset (%) BER (%) Sample Population Used FER % Number of Frames Used
Raw IQ Data Waveform Spectrum

Page 8 | ni.com | Bluetooth Test Toolkit

Platform-Based Approach to Test and Measurement
What Is PXI?
Powered by software, PXI is a rugged PC-based platform for measurement and automation systems. PXI combines PCI electrical-bus features with the modular, Eurocard packaging of CompactPCI and then adds specialized synchronization buses and key software features. PXI is both a high-performance and low-cost deployment platform for applications such as manufacturing test, military and aerospace, machine monitoring, automotive, and industrial test. Developed in 1997 and launched in 1998, PXI is an open industry standard governed by the PXI Systems Alliance (PXISA), a group of more than 70 companies chartered to promote the PXI standard, ensure interoperability, and maintain the PXI specification.
Integrating the Latest Commercial Technology
By leveraging the latest commercial technology for our products, we can continually deliver highperformance and high-quality products to our users at a competitive price. The latest PCI Express Gen 3 switches deliver higher data throughput, the latest Intel multicore processors facilitate faster and more efficient parallel (multisite) testing, the latest FPGAs from Xilinx help to push signal processing algorithms to the edge to accelerate measurements, and the latest data converters from TI and ADI continually increase the measurement range and performance of our instrumentation.
Page 9 | ni.com | Digital Multimeters

PXI Instrumentation
NI offers more than 600 different PXI modules ranging from DC to mmWave. Because PXI is an open industry standard, nearly 1,500 products are available from more than 70 different instrument vendors. With standard processing and control functions designated to a controller, PXI instruments need to contain only the actual instrumentation circuitry, which provides effective performance in a small footprint. Combined with a chassis and controller, PXI systems feature high-throughput data movement using PCI Express bus interfaces and sub-nanosecond synchronization with integrated timing and triggering.

Oscilloscopes
Sample at speeds up to 12.5 GS/s with 5 GHz of analog bandwidth, featuring numerous triggering modes and deep onboard memory
Digital Instruments
Perform characterization and production test of semiconductor devices with timing sets and per channel pin parametric measurement unit (PPMU)
Frequency Counters
Perform counter timer tasks such as event counting and encoder position, period, pulse, and frequency measurements
Power Supplies & Loads
Supply programmable DC power, with some modules including isolated channels, output disconnect functionality, and remote sense
Switches (Matrix & MUX)
Feature a variety of relay types and row/column configurations to simplify wiring in automated test systems
GPIB, Serial, & Ethernet
Integrate non-PXI instruments into a PXI system through various instrument control interfaces

Digital Multimeters
Perform voltage (up to 1000 V), current (up to 3A), resistance, inductance, capacitance, and frequency/period measurements, as well as diode tests
Waveform Generators
Generate standard functions including sine, square, triangle, and ramp as well as user-defined, arbitrary waveforms
Source Measure Units
Combine high-precision source and measure capability with high channel density, deterministic hardware sequencing, and SourceAdapt transient optimization
FlexRIO Custom Instruments & Processing
Provide high-performance I/O and powerful FPGAs for applications that require more than standard instruments can offer
Vector Signal Transceivers
Combine a vector signal generator and vector signal analyzer with FPGA-based, real-time signal processing and control
Data Acquisition Modules
Provide a mix of analog I/O, digital I/O, counter/timer, and trigger functionality for measuring electrical or physical phenomena

Page 10 | ni.com | Digital Multimeters

Hardware Services
All NI hardware includes a one-year warranty for basic repair coverage, and calibration in adherence to NI specifications prior to shipment. PXI Systems also include basic assembly and a functional test. NI offers additional entitlements to improve uptime and lower maintenance costs with service programs for hardware. Learn more at ni.com/services/hardware.

Program Duration

Standard Premium Description 3 or 5 years 3 or 5 years Length of service program

Extended Repair Coverage

System

Configuration,

Assembly, and Test1

Advanced Replacement2

System Return
Material Authorization (RMA)1

NI restores your device’s functionality and includes firmware updates and factory calibration.

NI technicians assemble, install software in, and test your system per your custom configuration prior to shipment.

NI stocks replacement hardware that can be shipped immediately if a repair is needed.

NI accepts the delivery of fully assembled systems when performing repair services.

Calibration Plan (Optional)

Standard

Expedited3

NI performs the requested level of calibration at the specified calibration interval for the duration of the service program.

1This option is only available for PXI, CompactRIO, and CompactDAQ systems. 2This option is not available for all products in all countries. Contact your local NI sales engineer to confirm availability. 3Expedited calibration only includes traceable levels.
PremiumPlus Service Program
NI can customize the offerings listed above, or offer additional entitlements such as on-site calibration, custom sparing, and life-cycle services through a PremiumPlus Service Program. Contact your NI sales representative to learn more.

Technical Support
Every NI system includes a 30-day trial for phone and e-mail support from NI engineers, which can be extended through a Software Service Program (SSP) membership. NI has more than 400 support engineers available around the globe to provide local support in more than 30 languages. Additionally, take advantage of NI’s award winning online resources and communities.

©2017 National Instruments. All rights reserved. LabVIEW, National Instruments, NI, NI TestStand, and ni.com are trademarks of National Instruments. Other product and company names listed are trademarks or trade names of their respective companies. The contents of this Site could contain technical inaccuracies, typographical errors or out-of-date information. Information may be updated or changed at any time, without notice. Visit ni.com/manuals for the latest information.
18 August 2017
Page 11 | ni.com | Digital Multimeters